K.S. Tkachenko FSAEI HE “Sevastopol State University”, SevastopolKSTkachenko@sevsu.ru Al’manac of Modern Metrology № 4 (20) 2019, pages 200–205 Modern measuring instruments are very complex and include computer equipment. Components of such devices can degrade under the influence of changes in the characteristics of the input stream of events. After degradation to a certain level, the … Continue reading Analytical model of the degrading and self-healing measuring device on the basis of a computer node in the drift characteristics of the input stream